Your shopping cart is empty!
ASTM International, 10/15/2011
Publisher: ASTM
File Format: PDF
$25.00$50.00
Published:15/10/2011
Pages:2
File Size:1 file , 63 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.
1.2 The terms are listed in alphabetical order.
Standard Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique
$29.00 $58.00
Standard Specification for Copper-Nickel-Zinc (Nickel Silver) Wire and Copper-Nickel Alloy Wire
$26.00 $52.00
Standard Test Method for Accelerated Compressive Creep of Geosynthetic Materials Based on Time-Temperature Superposition Using the Stepped Isothermal Method
Standard Practice for Storage Testing of Aerosol Products
$21.00 $42.00