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ASTM International, 02/15/2013
Publisher: ASTM
File Format: PDF
$24.00$48.00
Published:15/02/2013
Pages:9
File Size:1 file , 110 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This guide is an outline of methods for scanning electron microscopy (SEM) intended for use by forensic paint examiners. This guide is intended to supplement information presented in Guide E1610.
1.2 The methods used by each examiner or laboratory or both depend upon sample size, sample suitability, and laboratory equipment.
1.3 The term “scanning electron microscopy” occasionally refers to the entire analytical system including energy dispersive X-ray spectrometry (EDS) or wavelength dispersive X-ray spectrometry (WDS) or both.
1.4 This guide does not cover the theoretical aspects of many of the topics presented.
1.5 This guide cannot replace knowledge, skill, or ability acquired through appropriate education, training, and experience and should be used in conjunction with sound professional judgment.
1.6 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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