• ASTM F1893-98

ASTM F1893-98

Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices

ASTM International, 05/10/1998

Publisher: ASTM

File Format: PDF

$29.00$58.00


Published:10/05/1998

Pages:5

File Size:1 file , 49 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.

1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

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