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ASTM International, 05/10/1998
Publisher: ASTM
File Format: PDF
$29.00$58.00
Published:10/05/1998
Pages:5
File Size:1 file , 49 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
Standard Practice for Resistance of Cured Coatings to Thermal Cycling
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Standard Specification for Electric Fusion-Welded Ni-Cr-Co-Mo Alloy (UNS N06617), Ni-Fe-Cr-Si Alloys (UNS N08330 and UNS N08332),Ni-Cr-Fe-Al Alloy (UNS N06603), Ni-Cr-Fe Alloy (UNS N06025), and Ni-Cr-Fe-Si Alloy (UNS N06045) Pipe
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Standard Guide for Determining the Presence of and Removing Microbial (Fungal or Algal) Growth on Paint and Related Coatings
Standard Test Method for Pin-Type Bearing Test of Metallic Materials
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