BS 04/30126443 DC

IEC 60749-38 ED.1. Semiconductor devices mechanical and climatic test methods. Part 38. Soft error rate testing of electronic components

BSI Group, 12/08/2004

Publisher: BS

File Format: PDF

$129.00$258.99

Description

Published:08/12/2004

Pages:11

All current amendments available at time of purchase are included with the purchase of this document.

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