BS 07/30171395 DC

BS EN 62374-1. Semiconductor devices. Part 1. Time dependent dielectric breakdown test (TDDB)for inter-metal layers

BSI Group, 11/19/2007

Publisher: BS

File Format: PDF

$100.00$201.26

Published:19/11/2007

Pages:15

Cross References:
IEC-60747

All current amendments available at time of purchase are included with the purchase of this document.

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