BS 6493-3:1985

Semiconductor devices-Mechanical and climatic test methods

BSI Group, 01/31/1986

Publisher: BS

File Format: PDF

$147.00$294.64

Description

Published:31/01/1986

Pages:42

File Size:1 file

Note:This product is unavailable in Ukraine, Russia, Belarus

Special requirements for test methods additional to IEC 60068, and certain specific and complete test methods.

All current amendments available at time of purchase are included with the purchase of this document.

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