BS CECC 00013:1985

Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice

BSI Group, 08/30/1985

Publisher: BS

File Format: PDF

$125.00$251.46

Published:30/08/1985

Pages:24

File Size:1 file , 820 KB

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Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.

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