• Your shopping cart is empty!

  • BS CECC 20000:1983

BS CECC 20000:1983

Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices

BSI Group, 06/30/1983

Publisher: BS

File Format: PDF

$189.00$378.46


Published:30/06/1983

Pages:100

File Size:1 file , 6.1 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

Prescribes quality assessment procedures and test and measurement conditions applicable to semiconductor optoelectronic and liquid crystal devices.

Cross References:
BS 1991
BS 2011:Part 1.1
BS 2011:Part 2.1B
BS 2011:Part 2.1Ca
BS 2011:Part 2.1Da
BS 2011:Part 2.1Db
BS 2011:Part 2.1Ea
BS 2011:Part 2.1Fc
BS 2011:Part 2.1Ga
BS 2011:Part 2.1N
BS 2011:Part 2.1Q
BS 2011:Part 2.1T
BS 2011:Part 2.1U
BS 2011:Part 2.1Z/AD
BS 2045
BS 3363
BS 3934
BS 3939
BS 4727:Part 4:Group 01
BS 5555
BS 6001
BS 9000:Part 2
BS 9300
BS E9007
ISO/R 2015
IEC 134
IEC 306


Replaced by BS EN 120000:1996 but remains current.

Incorporates the following:
AMD 4606 published 31 October 1984
AMD 5800 published 28 February 1989

More BS standard pdf

BS 4999-142:1987

BS 4999-142:1987

General requirements for rotating electrical machines-Specification for mechanical performance: vibration

$44.00 $88.90

BS 6288-6:1987

BS 6288-6:1987

Magnetic tape sound recording and reproducing systems-Specification for reel-to-reel systems

$125.00 $251.46

BS 6809:1987

BS 6809:1987

Method for calibration of radiometers for use in fire testing

$85.00 $170.18

BS 6829-1.1:1987

BS 6829-1.1:1987

Analysis of surface active agents (raw materials). General methods-Method for determination of mineral sulphate content

$76.00 $152.40