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IEC 60747-11 Ed. 1.0 b:1985

Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

International Electrotechnical Commission, 01/01/1985

Publisher: IEC

File Format: PDF

$48.00$97.00


Published:01/01/1985

Pages:35

File Size:1 file , 1.3 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices.

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