• Your shopping cart is empty!

PDF Preview

IEC 60749-17 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

International Electrotechnical Commission, 02/20/2003

Publisher: IEC

File Format: PDF

$11.00$23.00


Published:20/02/2003

Pages:11

File Size:1 file , 410 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

More IEC standard pdf

IEC 61053-2 Ed. 1.0 b:1991

IEC 61053-2 Ed. 1.0 b:1991

Helical-scan video tape cassette system using 12,65 mm (0,5 in)magnetic tape on type Beta format - FM audio recording - Part 2:525 line-60 field systems

$25.00 $51.00

IEC 61020-5-1 Ed. 1.0 b:1991

IEC 61020-5-1 Ed. 1.0 b:1991

Electromechanical switches for use in electronic equipment - Part 5: Sectional specification for pushbutton switches - Section 1: Blank detail specification

$25.00 $51.00

IEC 62150-4 Ed. 1.0 en:2009

IEC 62150-4 Ed. 1.0 en:2009

Fibre optic active components and devices - Test and measurement procedures - Part 4: Relative intensity noise using a time-domain optical detection system

$36.00 $73.00

IEC 61577-1 Ed. 2.0 b:2006

IEC 61577-1 Ed. 2.0 b:2006

Radiation protection instrumentation - Radon and radon decay product measuring instruments - Part 1: General principles

$95.00 $190.00