IEC 60749-17 Ed. 2.0 b:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

International Electrotechnical Commission, 03/28/2019

Publisher: IEC

File Format: PDF

$25.00$51.00

Description

Published:28/03/2019

Pages:17

File Size:1 file , 1000 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

More IEC standard pdf

IEC 60335-2-21 Ed. 5.2 b:2009

Household and similar electrical appliances - Safety - Part 2-21: Particular requirements for storage water heaters CONSOLIDATED EDITION

$121.00 $243.00

IEC 62440 Ed. 1.0 b:2008

Electric cables with a rated voltage not exceeding 450/750 V - Guide to use

$95.00 $190.00

IEC 60423 Ed. 3.0 b:2007

Conduit systems for cable management - Outside diameters of conduits for electrical installations and threads for conduits and fittings

$47.00 $95.00

IEC 60901 Amd.4 Ed. 2.0 b:2007

Amendment 4 - Single-capped fluorescent lamps - Performance specifications

$183.00 $367.00