• IEC 60749-19 Amd.1 Ed. 1.0 b:2010

IEC 60749-19 Amd.1 Ed. 1.0 b:2010

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

International Electrotechnical Commission, 07/28/2010

Publisher: IEC

File Format: PDF

$6.00$13.00


Published:28/07/2010

Pages:4

File Size:1 file , 280 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

More IEC standard pdf

IEC 60807-8 Ed. 1.0 b:1992

IEC 60807-8 Ed. 1.0 b:1992

Rectangular connectors for frequencies below 3 MHz - Part 8: Detail specification for connectors, four-signal contacts and earthing contacts for cable screen

$164.00 $329.00

IEC 60477-2 Ed. 1.0 b:1979

IEC 60477-2 Ed. 1.0 b:1979

Laboratory resistors. Part 2: Laboratory a.c. resistors

$44.00 $89.00

IEC 60079-10-1 Ed. 1.0 b:2008

IEC 60079-10-1 Ed. 1.0 b:2008

Explosive atmospheres - Part 10-1: Classification of areas - Explosive gas atmospheres

$169.00 $339.00

IEC 60915 Ed. 2.0 b COR. 1:2008

IEC 60915 Ed. 2.0 b COR. 1:2008

Corrigendum 1 - Fixed capacitors for use in electronic equipment - Preferred dimensions of shaft ends, bushes and for the mounting of single-hole, bush-mounted, shaft-operated electronic components

$146.00 $293.22