IEC 60749-36 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

International Electrotechnical Commission, 02/13/2003

Publisher: IEC

File Format: PDF

$6.00$13.00

Description

Published:13/02/2003

Pages:7

File Size:1 file , 210 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

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