• Your shopping cart is empty!

PDF Preview

IEC 60749-8 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

International Electrotechnical Commission, 08/30/2002

Publisher: IEC

File Format: PDF

$47.00$95.00


Published:30/08/2002

Pages:31

File Size:1 file , 560 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

More IEC standard pdf

IEC 60635 Amd.1 Ed. 1.0 b:1997

IEC 60635 Amd.1 Ed. 1.0 b:1997

Amendment 1 - Toroidal strip-wound cores made of magnetically soft material

$6.00 $13.00

IEC 60601-2-45 Ed. 2.0 b:2001

IEC 60601-2-45 Ed. 2.0 b:2001

Medical electrical equipment - Part 2-45: Particular requirements for the safety of mammographic X-ray equipment and mammographic stereotactic devices

$89.00 $179.00

IEC 61828 Ed. 1.0 b:2001

IEC 61828 Ed. 1.0 b:2001

Ultrasonics - Focusing transducers - Definitions and measurement methods for the transmitted fields

$158.00 $317.00

IEC 60564 Amd.2 Ed. 1.0 b:1997

IEC 60564 Amd.2 Ed. 1.0 b:1997

Amendment 2 - D.C. bridges for measuring resistance

$6.00 $13.00