IEC 61163-1 Ed. 2.0 b:2006

Reliability stress screening - Part 1: Repairable assemblies manufactured in lots

International Electrotechnical Commission, 06/26/2006

Publisher: IEC

File Format: PDF

$208.00$417.00

Description

Published:26/06/2006

Pages:161

File Size:1 file , 1.4 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.

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