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IEC 61164 Ed. 2.0 en:2004

Reliability growth - Statistical test and estimation methods

International Electrotechnical Commission, 03/24/2004

Publisher: IEC

File Format: PDF

$121.00$243.00


Published:24/03/2004

Pages:55

File Size:1 file , 780 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.

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