IEC 62374 Ed. 1.0 b:2007

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

International Electrotechnical Commission, 03/29/2007

Publisher: IEC

File Format: PDF

$95.00$190.00

Description

Published:29/03/2007

Pages:43

File Size:1 file , 720 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

More IEC standard pdf

IEC 60938-2 Amd.1 Ed. 2.0 en:2006

Amendment 1 - Fixed inductors for electromagnetic interference suppression - Part 2: Sectional specification

$30.00 $61.00

IEC 60384-25-1 Ed. 1.0 b:2006

Fixed capacitors for use in electronic equipment - Part 25-1: Blank detail specification - Surface mount fixed aluminium electrolytic capacitors with conductive polymer solid electrolyte - Assessment level EZ

$47.00 $95.00

IEC 60384-24-1 Ed. 1.0 b:2006

Fixed capacitors for use in electronic equipment - Part 24-1: Blank detail specification - Surface mount fixed tantalum electrolytic capacitors with conductive polymer solid electrolyte - Assessment level EZ

$47.00 $95.00

IEC 61935-2-20 Ed. 1.0 b:2008

Testing of balanced communication cabling in accordance with ISO/IEC 11801 - Part 2-20: Patch cords and work area cords - Blank detail specification for class D applications

$25.00 $51.00