IEC 62878-1-1 Ed. 1.0 b:2015

Device embedded substrate - Part 1-1: Generic specification - Test methods

International Electrotechnical Commission, 05/20/2015

Publisher: IEC

File Format: PDF

$183.00$367.00

Description

Published:20/05/2015

Pages:109

File Size:1 file , 1.9 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

More IEC standard pdf

IEC 61992-6 Ed. 1.2 b:2020

Railway applications - Fixed installations - DC switchgear - Part 6:DC switchgear assemblies CONSOLIDATED EDITION

$205.00 $410.00

IEC 62351-4 Amd.1 Ed. 1.0 b:2020

Amendment 1 - Power systems management and associated information exchange - Data and communications security - Part 4: Profiles including MMS and derivatives

$155.00 $310.00

IEC 62351-4 Ed. 1.1 b:2020

Power systems management and associated information exchange - Data and communications security - Part 4: Profiles including MMS and derivatives CONSOLIDATED EDITION

$506.00 $1,012.00

IEC 61869-13 Ed. 1.0 b:2021

Instrument transformers - Part 13: Stand-alone merging unit (SAMU)

$208.00 $417.00