IEEE 1149.1-2001

This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to ¿¿¿ testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate; ¿¿¿ testing the integrated circuit itself; and ¿¿¿ observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).