IEEE 1450.4-2017

This standard specifies extensions to STIL.0 that define the description of certain test flow and binning components of an integrated circuit (IC) test program in a test-hardware-independent manner. These extensions provide language constructs and semantics necessary to describe both the test program flow and the sequencing data needed to compose a test program to run on an automated test equipment (ATE) platform. The language constructs defined include structures for specifying the following: *Order of execution of test program components *Hierarchical test flow structures to facilitate automated modification or maintenance *Common interfaces between the test flow environment and test program components *Test flow variables to facilitate concurrent and serial test flow interactions *Binning or categorization of tested ICs The following aspects integral to test execution are specifically not addressed by this standard: *The standardization of the interface between the prober or handler and tester is beyond the scope of STIL.4. STIL.4 requires that appropriate AsynchronousEvent signals shall be issued to the TestProgram triggering the corresponding entry-points. * Input/output operations and exception handling. * The definition of TestMethods is beyond the scope of this standard.