IEEE 1687-2014

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

IEEE, 12/05/2014

Publisher: IEEE

File Format: PDF

$134.00$268.00

Description

Published:05/12/2014

Pages:266

File Size:1 file , 8 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard develops a methodology for access to embedded instrumentation, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and additional signals that may be required. The elements of the methodology include a description language for the characteristics of the features and for communication with the features, and requirements for interfacing to the features.

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