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JEDEC Solid State Technology Association, 11/01/2014
Publisher: JEDEC
File Format: PDF
$25.00$51.00
Published:01/11/2014
Pages:10
File Size:1 file , 220 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
METHOD FOR CHARACTERIZING THE ELECTROMIGRATION FAILURE TIME DISTRIBUTION OF INTERCONNECTS UNDER CONSTANT-CURRENT AND TEMPERATURE STRESS
$30.00 $61.00
CURRENT TIN WHISKERS THEORY AND MITIGATION PRACTICES GUIDELINE
$36.00 $72.00
STANDARD TEST LOADS FOR DUAL-SUPPLY LEVEL TRANSLATION DEVICES
$25.00 $51.00
STATISTICAL PROCESS CONTROL SYSTEMS
$37.00 $74.00