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  • JEDEC JEP 122F

JEDEC JEP 122F

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

JEDEC Solid State Technology Association, 11/01/2010

Publisher: JEDEC

File Format: PDF

$70.00$141.00


Published:01/11/2010

Pages:105

File Size:1 file , 2 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum of the Failure Rates method.

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