JEDEC JEP176

ADAPTER TEST BOARD RELIABILITY TEST GUIDELINES

JEDEC Solid State Technology Association, 01/01/2018

Publisher: JEDEC

File Format: PDF

$31.00$62.00


Published:01/01/2018

Pages:22

File Size:1 file , 150 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This publication describes guidelines for applying JEDEC reliability tests and recommended testing procedures to integrated circuits that require adapter test boards for electrical and reliability testing. These tests are used frequently in qualifying integrated circuits as a new product, a product family, or as products in a process which is being changed.

More JEDEC standard pdf

JEDEC JESD22-A101C

JEDEC JESD22-A101C

STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST

$26.00 $53.00

JEDEC JESD 209A-1

JEDEC JESD 209A-1

Addendum No. 1 to JESD209A - LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM, 1.2 V I/O

$26.00 $53.00

JEDEC JESD82-20A

JEDEC JESD82-20A

FBDIMM: ADVANCED MEMORY BUFFER (AMB)

$114.00 $228.00

JEDEC JEP 122E

JEDEC JEP 122E

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

$70.00 $141.00