JEDEC JEP195

Guideline for Evaluating Gate Switching Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion

JEDEC Solid State Technology Association, 02/01/2023

Publisher: JEDEC

File Format: PDF

$114.00$228.78


Published:01/02/2023

Pages:22

File Size:1 file , 570 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This document elaborates on the information given in JEP184 regarding the long-time stability of device parameters under static conditions and under application near switching conditions.

More JEDEC standard pdf

JEDEC JESD 8-22

JEDEC JESD 8-22

HSUL_12 LPDDR2 I/O

$36.00 $72.00

JEDEC JESD 84-C44

JEDEC JESD 84-C44

EMBEDDED MULTIMEDIACARD (e-MMC) MECHANICAL STANDARD, WITH OPTIONAL RESET SIGNAL

$27.00 $54.00

JEDEC JESD22-B116A

JEDEC JESD22-B116A

WIRE BOND SHEAR TEST

$31.00 $62.00

JEDEC JIG 101 Ed. 2.0

JEDEC JIG 101 Ed. 2.0

Material Composition Declaration for Electronic Products

$40.00 $80.00