Your shopping cart is empty!
PDF Preview
JEDEC Solid State Technology Association, 02/01/2017
Publisher: JEDEC
File Format: PDF
$152.00$305.00
Published:01/02/2017
Pages:307
File Size:1 file , 7.5 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
QUALITY SYSTEM ASSESSMENT (SUPERSEDES JESD39-A)
$40.00 $80.00
THERMAL TEST CHIP GUIDELINE (WIRE BOND TYPE CHIP)
$28.00 $56.00
TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
$43.00 $87.00
ADDENDUM No. 11 to JESD24 - POWER MOSFET EQUIVALENT SERIES GATE RESISTANCE TEST METHOD
$24.00 $48.00