• JEDEC JESD213

JEDEC JESD213

STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) - LEAD (Pb) CONTENT

JEDEC Solid State Technology Association, 03/01/2010

Publisher: JEDEC

File Format: PDF

$26.00$53.00


Published:01/03/2010

Pages:11

File Size:1 file , 200 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This document is intended to be used by Original Component Manufacturers who deliver electronic components and Original Equipment Manufacturers who are the platform system integrators. It is intended to be applied prior to delivery by the OCMs and may be used by OEM system engineers and procuring activities as well as U.S Government Department of Defense system engineers, procuring activities and repair centers. This Standard establishes the instrumentation, techniques, criteria, and methods to be utilized to quantify the amount of Lead (Pb) in Tin-Lead (Sn/Pb) alloys and electroplated finishes containing at least 3 weight percent (wt%) Lead (Pb) using X-Ray Fluorescence (XRF) equipment.

More JEDEC standard pdf

JEDEC JESD84-B50.1

JEDEC JESD84-B50.1

Embedded Multi-media card (e*MMC), Electrical Standard (5.01)

$152.00 $305.00

JEDEC JESD22-B117B

JEDEC JESD22-B117B

SOLDER BALL SHEAR

$31.00 $62.00

JEDEC JESD216B

JEDEC JESD216B

SERIAL FLASH DISCOVERABLE PARAMETERS (SFDP)

$45.00 $91.00

JEDEC JESD237

JEDEC JESD237

Reliability Qualification of Power Amplifier Modules

$33.00 $67.00