Your shopping cart is empty!
PDF Preview
JEDEC Solid State Technology Association, 12/01/2022
Publisher: JEDEC
File Format: PDF
$112.00$225.35
Published:01/12/2022
Pages:13
File Size:1 file , 170 KB
Note:This product is unavailable in Russia, Belarus
This test is conducted to determine the robustness of a device to sudden exposure to extreme changes in temperature and to the effect of alternate exposures to these extremes.
FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
$29.00 $59.00
Guide to Standards and Publications Relating to Quality and Reliability of Electronic Hardware
$53.00 $106.00
HIGH BANDWIDTH MEMORY (HBM) DRAM
$95.00 $191.00
QUALITY SYSTEM ASSESSMENT
$36.00 $72.00
