• JEDEC JESD22-A110E

JEDEC JESD22-A110E

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)

JEDEC Solid State Technology Association, 07/01/2015

Publisher: JEDEC

File Format: PDF

$27.00$54.00


Published:01/07/2015

Pages:14

File Size:1 file , 160 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The purpose of this test method is to evaluate the reliability of nonhermetic packaged solid state devices in humid environments. It employs severe conditions of temperature, humidity, and bias that accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.

More JEDEC standard pdf

JEDEC JESD218A

JEDEC JESD218A

SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD

$38.00 $76.00

JEDEC JESD47H

JEDEC JESD47H

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

$33.00 $67.00

JEDEC JESD 82-29A

JEDEC JESD 82-29A

DEFINITION OF THE SSTE32882 REGISTERING CLOCK DRIVER WITH PARITY AND QUAD CHIP SELECTS FOR DDR3/DDR3L/DDR3U RDIMM 1.5 V/1.35 V/1.25 V APPLICATIONS

$58.00 $116.00

JEDEC JESD22-A108D

JEDEC JESD22-A108D

TEMPERATURE, BIAS, AND OPERATING LIFE

$27.00 $54.00