• JEDEC JESD22-A122A

JEDEC JESD22-A122A

Power Cycling

JEDEC Solid State Technology Association, 06/01/2016

Publisher: JEDEC

File Format: PDF

$30.00$60.00


Published:01/06/2016

Pages:21

File Size:1 file , 120 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This Test Method establishes a uniform method for performing component package power cycling stress test. This specification covers power induced temperature cycling of a packaged component, simulating the non-uniform temperature distribution resulting from a device powering on and off in the application.

More JEDEC standard pdf

JEDEC JESD309-S0-RCB

JEDEC JESD309-S0-RCB

DDR5 SODIMM Raw Card Annex B. Version 1.0

$124.00 $248.11

JEDEC JESD82-29A.01

JEDEC JESD82-29A.01

DEFINITION OF THE SSTE32882 REGISTERING CLOCK DRIVER WITH PARITY AND QUAD CHIP SELECTS FOR DDR3/DDR3L/DDR3U RDIMM 1.5 V/1.35 V/1.25 V APPLICATIONS

$109.00 $218.35

JEDEC JESD220F

JEDEC JESD220F

Universal Flash Storage (UFS)

$184.00 $369.00

JEDEC JESD308

JEDEC JESD308

DDR5 Unbuffered Dual Inline Memory Module (UDIMM) Common Standard

$145.00 $290.40