JEDEC JESD22-B116B

WIRE BOND SHEAR TEST

JEDEC Solid State Technology Association, 04/01/2017

Publisher: JEDEC

File Format: PDF

$37.00$74.00


Published:01/04/2017

Pages:32

File Size:1 file , 1.8 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

This test provides a means for determining the strength of a gold ball bond to a die bonding surface or an aluminum wedge or stitch bond to a die or package bonding surface, and may be performed on pre-encapsulation or post-encapsulation parts. The wire bond shear test is destructive. It is appropriate for use in process development, process control and/or quality assurance.

More JEDEC standard pdf

JEDEC JEP137B

JEDEC JEP137B

COMMON FLASH INTERFACE (CFI) IDENTIFICATION CODES

$26.00 $53.00

JEDEC JESD75-4

JEDEC JESD75-4

BALL GRID ARRAY PINOUT FOR 1-, 2-, AND 3-BIT LOGIC FUNCTIONS

$26.00 $53.00

JEDEC JESD64-A

JEDEC JESD64-A

STANDARD FOR DESCRIPTION OF 2.5 V CMOS LOGIC DEVICES WITH 3.6 V CMOS TOLERANT INPUTS AND OUTPUTS

$25.00 $51.00

JEDEC JESD82

JEDEC JESD82

DEFINITION OF CDCV857 PLL CLOCK DRIVER FOR REGISTERED DDR DIMM APPLICATIONS

$29.00 $59.00