JEDEC JESD226

RF Biased Life (RFBL) Test Method

JEDEC Solid State Technology Association, 01/01/2013

Publisher: JEDEC

File Format: PDF

$30.00$60.00

Description

Published:01/01/2013

Pages:20

File Size:1 file , 170 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This stress method is used to determine the effects of RF bias conditions and temperature on Power Amplifier Modules (PAMs) over time. These conditions are intended to simulate the devices? operating condition in an accelerated way, and they are expected to be applied primarily for device qualification and reliability monitoring.

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