Your shopping cart is empty!
JEDEC Solid State Technology Association, 01/01/2014
Publisher: JEDEC
File Format: PDF
$25.00$51.00
Published:01/01/2014
Pages:10
File Size:1 file , 49 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
$37.00 $74.00
Lognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Method
$38.00 $76.00
CONSTANT-TEMPERATURE AGING METHOD TO CHARACTERIZE COPPER INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING
$36.00 $72.00
Descriptive Designation System for Semiconductor-device Packages
$58.00 $116.00