JEDEC JESD6 (R2002)

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

JEDEC Solid State Technology Association, 02/01/1967

Publisher: JEDEC

File Format: PDF

$29.00$59.00

Description

Published:01/02/1967

Pages:17

File Size:1 file , 280 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.

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