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  • JEDEC JESD89-1A

JEDEC JESD89-1A

TEST METHOD FOR REAL-TIME SOFT ERROR RATE

JEDEC Solid State Technology Association, 10/01/2007

Publisher: JEDEC

File Format: PDF

$28.00$56.00


Published:01/10/2007

Pages:15

File Size:1 file , 140 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This test is used to determine the Soft Error Rate (SER) of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) for errors which require no more than re-reading or re-writing to correct and as used in terrestrial environments. It simulates the operating condition of the device and is used for qualification, characterization, or reliability monitoring. This test is intended for execution in ambient conditions without the artificial introduction of radiation sources.

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