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International Electrotechnical Commission, 01/01/2023
Publisher: IEC
File Format: PDF
$10,473.00$20,946.00
Published:01/01/2023
File Size:1 file , 270 MB
A 15% discount of the total catalogue price is included. This pack contains the following: IEC TR 61850-1:2013 IEC TS 61850-1-2:2020+AMD1:2022 CSV IEC TS 61850-2:2019 IEC 61850-3:2013 IEC 61850-4:2011+AMD1:2020 CSV IEC 61850-5:2013+AMD1:2022 CSV IEC 61850-6:2009+AMD1:2018 CSV IEC 61850-7-1:2011+AMD1:2020 CSV IEC 61850-7-2:2010+AMD1:2020 CSV IEC 61850-7-3:2010+AMD1:2020 CSV IEC 61850-7-4:2010+AMD1:2020 CSV IEC TR 61850-7-5:2021 IEC TR 61850-7-6:2019 IEC TS 61850-7-7:2018+AMD1:2023 CSV IEC 61850-7-410:2012+AMD1:2015 CSV IEC 61850-7-420:2021 IEC TR 61850-7-500:2017 IEC TR 61850-7-510:2021 IEC 61850-8-1:2011+AMD1:2020 CSV IEC 61850-8-2:2018 IEC 61850-9-2:2011+AMD1:2020 CSV IEC/IEEE 61850-9-3:2016 IEC 61850-10:2012 IEC TR 61850-10-3:2022 IEC TS 61850-80-1:2016 IEC TR 61850-80-3:2015 IEC TS 61850-80-4:2016 IEC TR 61850-90-1:2010 IEC TR 61850-90-2:2016 IEC TR 61850-90-3:2016 IEC TR 61850-90-4:2020 IEC TR 61850-90-5:2012 IEC TR 61850-90-6:2018 IEC TR 61850-90-7:2013 IEC TR 61850-90-8:2016 IEC TR 61850-90-9:2020 IEC TR 61850-90-10:2017 IEC TR 61850-90-11:2020 IEC TR 61850-90-12:2020 IEC TR 61850-90-13:2021 IEC TR 61850-90-14:2021 IEC TR 61850-90-16:2021 IEC TR 61850-90-17:2017
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
$117.00 $234.00
Optical fibre cables - Part 2-11: Indoor cables - Detailed specification for simplex and duplex cables for use in premises cabling CONSOLIDATED EDITION
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Corrigendum 1 - Electrical accessories - Residual current monitors for household and similar uses (RCMs)
$118.00 $236.78
OPC Unified Architecture - Part 5: Information Model
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