JEDEC EIA 323 (R2002)

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

JEDEC Solid State Technology Association, 03/01/1966

Publisher: JEDEC

File Format: PDF

$25.00$51.00

Description

Published:01/03/1966

Pages:9

File Size:1 file , 300 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.

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