JEDEC JEP 79

LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS

JEDEC Solid State Technology Association, 09/01/1969

Publisher: JEDEC

File Format: PDF

$33.00$67.00

Published:01/09/1969

Pages:25

File Size:1 file , 150 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This publication is for photoconductive cells sensitive primarily in the visible and near infrared region.

POD135 - 1.35 V PSEUDO OPEN DRAIN I/O

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DDR4 NVDIMM-N Design Standard

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UNIVERSAL FLASH STORAGE (UFS) CARD EXTENSION

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ADAPTER TEST BOARD RELIABILITY TEST GUIDELINES

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