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JEDEC Solid State Technology Association, 04/01/2022
Publisher: JEDEC
File Format: PDF
$104.00$208.00
Published:01/04/2022
Pages:174
File Size:1 file , 6.9 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
The intent of this report is to document and provide critical information to assess and make decisions on safe CDM ESD level requirements. The scope of this document is to provide this information to quality organizations in both semiconductor companies and their IC customers.
RELATIVE SPECTRAL RESPONSE CURVES FOR SEMICONDUCTOR INFRARED DETECTORS
$33.00 $67.00
LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS
THE MEASUREMENT OF TRANSISTOR EQUIVALENT NOISE VOLTAGE AND EQUIVALENT NOISE CURRENT AT FREQUENCIES OF UP TO 20 kHz
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THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD