• JEDEC JESD 381-A (R2002)

JEDEC JESD 381-A (R2002)

METHOD OF DIODE Q MEASUREMENT

JEDEC Solid State Technology Association, 11/01/1981

Publisher: JEDEC

File Format: PDF

$30.00$60.00


Published:01/11/1981

Pages:20

File Size:1 file , 420 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard was updated and revised for the purpose of clarifying the method used to measure Q of a Voltage-Variable-Capacitance Diode in the low VHF range using an RF admittance bridge. Originally published November 1981. Approved as ANSI/EIA-381-A-1992, July 1992. Became JESD381-A after ANSI expiration July 2002.

More JEDEC standard pdf

JEDEC JEP123

JEDEC JEP123

GUIDELINE FOR MEASUREMENT OF ELECTRONIC PACKAGE INDUCTANCE AND CAPACITANCE MODEL PARAMETERS

$31.00 $62.00

JEDEC JESD 35-1

JEDEC JESD 35-1

ADDENDUM No. 1 to JESD35 - GENERAL GUIDELINES FOR DESIGNING TEST STRUCTURES FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS

$33.00 $67.00

JEDEC JESD 24-10 (R2002)

JEDEC JESD 24-10 (R2002)

ADDENDUM No. 10 to JESD24 - TEST METHOD FOR MEASUREMENT OF REVERSE RECOVERY TIME trr FOR POWER MOSFET DRAIN-SOURCE DIODES

$26.00 $53.00

JEDEC JESD8-6

JEDEC JESD8-6

ADDENDUM No. 6 to JESD8 - HIGH SPEED TRANSCEIVER LOGIC (HSTL)- A 1.5 V OUTPUT BUFFER SUPPLY VOLTAGE BASED INTERFACE STANDARD FOR DIGITAL INTEGRATED CIRCUITS

$30.00 $60.00