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  • JEDEC JESD51-1

JEDEC JESD51-1

INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)

JEDEC Solid State Technology Association, 12/01/1995

Publisher: JEDEC

File Format: PDF

$39.00$78.00


Published:01/12/1995

Pages:36

File Size:1 file , 560 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form of electrical package. This method will provide a basis for comparison of different devices housed in the same electronic package or similar devices housed in different electronic packages.

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