JEDEC JESD 22-B108A

COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES

JEDEC Solid State Technology Association, 01/01/2003

Publisher: JEDEC

File Format: PDF

$26.00$53.00

Description

Published:01/01/2003

Pages:11

File Size:1 file , 69 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity for surface-mount semiconductor devices.

More JEDEC standard pdf

JEDEC JESD 82-24

DEFINITION OF the SSTUB32865 28-bit 1:2 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS

$36.00 $72.00

JEDEC JESD82-9B

DEFINITION OF SSTU32865 REGISTERED BUFFER WITH PARITY FOR 2R x 4 DDR2 RDIMM APPLICATIONS

$33.00 $67.00

JEDEC JESD 82-23

DEFINITION OF the SSTUA32S869 AND SSTUA32D869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS

$37.00 $74.00

JEDEC JESD82-10A

DEFINITION OF THE SSTU32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS

$40.00 $80.00