JEDEC JESD25 (R2002)

MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS

JEDEC Solid State Technology Association, 11/01/1972

Publisher: JEDEC

File Format: PDF

$37.00$74.00

Published:01/11/1972

Pages:30

File Size:1 file , 480 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard provides a test method and definition for small-signal conditions at microwave frequencies.

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STUB SERIES TERMINATED LOGIC FOR 1.8 V (SSTL_18)

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PROCEDURE FOR CHARACTERIZING TIME-DEPENDENT DIELECTRIC BREAKDOWN OF ULTRA-THIN GATE DIELECTRICS

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A PROCEDURE FOR EXECUTING SWEAT

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