JEDEC JESD340 (R2009)

STANDARD FOR THE MEASUREMENT OF CRE

JEDEC Solid State Technology Association, 11/01/1967

Publisher: JEDEC

File Format: PDF

$27.00$54.00

Description

Published:01/11/1967

Pages:13

File Size:1 file , 410 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard offers an easily measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The measurement technique allows rapid testing. Its correlation to AC stability will help to establish the interchangeability of a device. Formerly known as RS-340 and/or EIA-340.

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