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JEDEC Solid State Technology Association, 07/01/2007
Publisher: JEDEC
File Format: PDF
$104.00$208.00
Published:01/07/2007
Pages:162
File Size:1 file , 1.9 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)
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STANDARD FOR DESCRIPTION OF LOW VOLTAGE TTL-COMPATIBLE CMOS LOGIC DEVICES
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